INVESTIGATION OF ALKALI-METAL MIGRATION AND ACCUMULATION IN THE SIO2-SI SYSTEM - STRUCTURE OF THE INTERFACE

被引：2

作者：

GERSHINSKII, AE ^{[1
]}

KRIVTSOVA, VL ^{[1
]}

MIRONOVA, LV ^{[1
]}

CHEREPOV, EI ^{[1
]}

机构：

[1] NOVOSIBIRSK STATE UNIV,NOVOSIBIRSK,USSR

来源：

THIN SOLID FILMS | 1980年 / 70卷 / 02期

关键词：

D O I：

10.1016/0040-6090(80)90375-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：341 / 349

页数：9

共 50 条

[41] DETECTION OF SIO-2(-) IONS FROM SIO2-SI INTERFACE BY MEANS OF SIMS
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