INVESTIGATION OF ALKALI-METAL MIGRATION AND ACCUMULATION IN THE SIO2-SI SYSTEM - STRUCTURE OF THE INTERFACE

被引：2
|
作者：
GERSHINSKII, AE [1 ]
KRIVTSOVA, VL [1 ]
MIRONOVA, LV [1 ]
CHEREPOV, EI [1 ]
机构：
[1] NOVOSIBIRSK STATE UNIV,NOVOSIBIRSK,USSR
来源：
THIN SOLID FILMS | 1980年 / 70卷 / 02期
关键词：
D O I：
10.1016/0040-6090(80)90375-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：341 / 349
页数：9
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