ACTIVATION AND DIFFUSION DURING RAPID THERMAL ANNEALING OF ARSENIC AND BORON IMPLANTED SILICON

被引:4
|
作者
GROB, JJ
UNAMUNO, S
GROB, A
AJAKA, M
SLAOUI, A
STUCK, R
机构
关键词
D O I
10.1016/S0168-583X(87)80100-3
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:501 / 506
页数:6
相关论文
共 50 条
  • [1] RAPID THERMAL ANNEALING OF ARSENIC AND BORON-IMPLANTED SILICON
    NARAYAN, J
    HOLLAND, OW
    EBY, RE
    WORTMAN, JJ
    OZGUZ, V
    ROZGONYI, GA
    [J]. APPLIED PHYSICS LETTERS, 1983, 43 (10) : 957 - 959
  • [2] TRANSIENT ENHANCED DIFFUSION DURING RAPID THERMAL ANNEALING OF BORON IMPLANTED SILICON
    CHO, K
    NUMAN, M
    FINSTAD, TG
    CHU, WK
    LIU, J
    WORTMAN, JJ
    [J]. APPLIED PHYSICS LETTERS, 1985, 47 (12) : 1321 - 1323
  • [3] ELECTRICAL ACTIVATION OF BORON-IMPLANTED SILICON DURING RAPID THERMAL ANNEALING
    LANDI, E
    ARMIGLIATO, A
    SOLMI, S
    KOGLER, R
    WIESER, E
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1988, 47 (04): : 359 - 366
  • [4] ELECTRICAL ACTIVATION OF BORON IMPLANTED SILICON DURING THE EARLY STAGE OF RAPID THERMAL ANNEALING
    KOGLER, R
    WIESER, E
    ARMIGLIATO, A
    LANDI, E
    SOLMI, S
    [J]. EPM 87: ENERGY PULSE AND PARTICLE BEAM MODIFICATION OF MATERIALS, 1988, 8 : 281 - 284
  • [5] Diffusion and segregation of arsenic and boron in polysilicon/silicon systems during rapid thermal annealing
    Merabet, A
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2004, 382 (1-2) : 300 - 304
  • [6] DOPANT PROFILE CONTROL BY RAPID THERMAL ANNEALING IN BORON AND ARSENIC IMPLANTED SILICON
    NARAYAN, J
    HOLLAND, DW
    EBY, R
    WORTMAN, JJ
    OZGUZ, V
    ROZGONYI, GA
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (11) : 1585 - 1585
  • [7] ENHANCED DIFFUSION PHENOMENA DURING RAPID THERMAL ANNEALING OF PREAMORPHIZED BORON-IMPLANTED SILICON
    GUIMARAES, S
    LANDI, E
    SOLMI, S
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1986, 95 (02): : 589 - 598
  • [8] PROLONGED AND RAPID THERMAL ANNEALING OF BORON IMPLANTED SILICON
    PETER, CR
    DESOUZA, JP
    HASENACK, CM
    [J]. JOURNAL OF APPLIED PHYSICS, 1988, 64 (05) : 2696 - 2699
  • [9] Modeling of high dose implanted boron diffusion during rapid thermal annealing
    Su, T
    Choi, PS
    Chang, RD
    Kwong, DL
    [J]. PROCEEDINGS OF THE FOURTH INTERNATIONAL SYMPOSIUM ON PROCESS PHYSICS AND MODELING IN SEMICONDUCTOR TECHNOLOGY, 1996, 96 (04): : 172 - 178
  • [10] ELECTRICAL ACTIVATION OF ARSENIC ION-IMPLANTED POLYCRYSTALLINE SILICON BY RAPID THERMAL ANNEALING
    WONG, CY
    KOMEM, Y
    HARRISON, HB
    [J]. APPLIED PHYSICS LETTERS, 1987, 50 (03) : 146 - 148