ACTIVATION AND DIFFUSION DURING RAPID THERMAL ANNEALING OF ARSENIC AND BORON IMPLANTED SILICON

被引:4
|
作者
GROB, JJ
UNAMUNO, S
GROB, A
AJAKA, M
SLAOUI, A
STUCK, R
机构
关键词
D O I
10.1016/S0168-583X(87)80100-3
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:501 / 506
页数:6
相关论文
共 50 条
  • [41] Two-dimensional modelling of diffusion of low-energy implanted arsenic in silicon at rapid thermal annealing
    Komarov, F. F.
    Mironov, A. M.
    Zayats, G. M.
    Tsurko, V. A.
    Velichko, O. I.
    Komarov, A. F.
    Belous, A. I.
    [J]. VACUUM, 2007, 81 (10) : 1184 - 1187
  • [42] Influence of thermal nitridation on the diffusion of arsenic during rapid thermal annealing
    Lerch, W
    Stolwijk, NA
    Marcus, SD
    Downey, DF
    Schäfer, M
    [J]. ADVANCES IN RAPID THERMAL PROCESSING, 1999, 99 (10): : 141 - 150
  • [43] RAPID THERMAL AND PULSED LASER ANNEALING OF BORON FLUORIDE-IMPLANTED SILICON
    NARAYAN, J
    HOLLAND, OW
    CHRISTIE, WH
    WORTMAN, JJ
    [J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (08) : 2709 - 2716
  • [44] PHOSPHORUS DIFFUSION IN SILICON DURING RAPID THERMAL ANNEALING
    NANU, L
    EVANS, AGR
    [J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1989, 4 (09) : 711 - 714
  • [45] Simulation of boron diffusion during low-temperature annealing of implanted silicon
    Velichko, O. I.
    Kavaliova, A. P.
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2013, 111 (04): : 1221 - 1227
  • [46] Simulation of boron diffusion during low-temperature annealing of implanted silicon
    O. I. Velichko
    A. P. Kavaliova
    [J]. Applied Physics A, 2013, 111 : 1221 - 1227
  • [47] Activation of Silicon Implanted with Phosphorus and Boron Atoms by Infrared Semiconductor Laser Rapid Annealing
    Ukawa, Kan
    Kanda, Yasushi
    Sameshima, Toshiyuki
    Sano, Naoki
    Naito, Masao
    Hamamoto, Nariaki
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2010, 49 (07) : 0765031 - 0765037
  • [48] RAPID THERMAL ANNEALING OF AS-IMPLANTED SILICON
    HO, CC
    KWOR, R
    JONES, K
    ARAUJO, C
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (08) : C330 - C330
  • [49] RAPID THERMAL ANNEALING OF As ION IMPLANTED SILICON
    Liu Shixiang Liu Xuejun Shi Wanquan (Graduate School
    USTC
    Academia Sinica)
    [J]. 中国科学院研究生院学报, 1989, (01) : 61 - 63
  • [50] PULSED THERMAL ANNEALING OF ARSENIC-IMPLANTED SILICON
    SCOVELL, PD
    [J]. ELECTRONICS LETTERS, 1981, 17 (12) : 403 - 405