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TEM OBSERVATION OF DARK DEFECTS APPEARING IN INGAASP-INP DOUBLE-HETEROSTRUCTURE LIGHT-EMITTING-DIODES AGED AT HIGH-TEMPERATURE
被引:13
|作者:
UEDA, O
KOMIYA, S
YAMAKOSHI, S
KOTANI, T
机构:
关键词:
D O I:
10.1143/JJAP.20.1201
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
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页码:1201 / 1210
页数:10
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