A TOPOLOGICAL APPROACH TO FAULT-DIAGNOSIS IN ANALOG CIRCUITS

被引：0
|
作者：
GAO, XC
LEACH, DP
CHAN, SP
机构：
来源：
INTERNATIONAL JOURNAL OF ELECTRONICS | 1986年 / 60卷 / 05期
关键词：
D O I：
10.1080/00207218608920815
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：545 / 560
页数：16
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