A symbolic approach for testability evaluation in fault diagnosis of nonlinear analog circuits

被引：0

作者：

Fedi, G ^{[1
]}

Giomi, R ^{[1
]}

Manetti, S ^{[1
]}

Piccirilli, MC ^{[1
]}

机构：

[1] Univ Florence, Dept Elect Engn, I-50139 Florence, Italy

来源：

ISCAS '98 - PROCEEDINGS OF THE 1998 INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-6 | 1998年

关键词：

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

A symbolic approach for testability evaluation in fault diagnosis of nonlinear analog circuits is presented. The new approach extends the methodologies developed for the linear case to circuits where nonlinear components, such as diodes or transistors, are present. The testability evaluation is a fundamental information for the fault diagnosis process, whatever method will be used, also in the nonlinear case. An example of circuit verifying this consideration and the validity of the proposed approach is briefly presented.

引用

页码：E9 / E12

页数：4

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