A new symbolic approach to the fault diagnosis of analog circuits

被引：0
|
作者：
Catelani, M [1 ]
Fedi, G [1 ]
Giraldi, S [1 ]
Luchetta, A [1 ]
Manetti, S [1 ]
Piccirilli, MC [1 ]
机构：
[1] UNIV FLORENCE,DEPT ELECTR ENGN,I-50139 FLORENCE,ITALY
来源：
JOINT CONFERENCE - 1996: IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE & IMEKO TECHNICAL COMMITTEE 7, CONFERENCE PROCEEDINGS, VOLS I AND II: QUALITY MEASUREMENTS: THE INDISPENSABLE BRIDGE BETWEEN THEORY AND REALITY (NO MEASUREMENTS? NO SCIENCE!) | 1996年
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D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
引用
收藏
页码：1182 / 1185
页数：4
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