A new symbolic approach to the fault diagnosis of analog circuits

被引：0

作者：

Catelani, M ^{[1
]}

Fedi, G ^{[1
]}

Giraldi, S ^{[1
]}

Luchetta, A ^{[1
]}

Manetti, S ^{[1
]}

Piccirilli, MC ^{[1
]}

机构：

[1] UNIV FLORENCE,DEPT ELECTR ENGN,I-50139 FLORENCE,ITALY

来源：

JOINT CONFERENCE - 1996: IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE & IMEKO TECHNICAL COMMITTEE 7, CONFERENCE PROCEEDINGS, VOLS I AND II: QUALITY MEASUREMENTS: THE INDISPENSABLE BRIDGE BETWEEN THEORY AND REALITY (NO MEASUREMENTS? NO SCIENCE!) | 1996年

关键词：

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

引用

页码：1182 / 1185

页数：4

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