Fused method of fault diagnosis for analog circuits

A fused fault diagnosis method based on wavelet packet decomposition of voltages of test nodes and current signals of terminals stimulated is proposed in the paper. For the faults difficult to detect merely from voltages of test nodes, the current signals of the terminals which contain sufficient information with various faults are fused with the sampled node voltages of the circuit stimulated by the sources selected according to the principles proposed to make up for the insufficiency of the node voltages resulting in maximization feature vectors and high identification of the fuzzy sets of faults. So higher correct classification rate is obtained to the sampled faults of circuits.