Application of IWO-SVM Approach in Fault Diagnosis of Analog Circuits

被引:0
|
作者
Cai, Shuxiang [1 ]
Yuan, Haiwen [1 ]
Lv, Jianxun [1 ]
Cui, Yong [1 ]
机构
[1] Beihang Univ, Sch Automat Sci & Elect Engn, Beijing 100191, Peoples R China
关键词
Fault Diagnosis; SVM; IWO; IWO-SVM; Analog Circuits; SELECTION;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Support vector machine (SVM) is a machine learning algorithm which has been applied to fault diagnosis of analog circuits. Invasive weed optimization (IWO) is a novel numerical optimization algorithm inspired from weed colonization. An approach that combines IWO and SVM (IWO-SVM) is proposed to fault diagnosis of analog circuits in this paper. The process of fault diagnosis of analog circuits using IWO-SVM approach is introduced in details. A biquadrate filter is used to test the performance of IWO-SVM approach for fault diagnosis. The simulation experiments show that the IWO-SVM approach proposed in this paper has a higher diagnosis accuracy rate than the conventional SVM in fault diagnosis of analog circuits.
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页码:4786 / 4791
页数:6
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