Fault diagnosis for linear analog circuits

被引：9

作者：

Lin, JW ^{[1
]}

Lee, CL

Su, CC

Chen, JE

机构：

[1] Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan

[2] Natl Cent Univ, Dept Elect Engn, Chungli 32054, Taiwan

[3] Chung Hwa Univ, Dept Elect Engn, Hsinchu, Taiwan

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2001年 / 17卷 / 06期

关键词：

fault diagnosis; signal flow graph; diagnosing evaluators; un-powered network;

D O I：

10.1023/A:1012816621144

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a novel scheme to diagnose single and double faults for linear analog circuits. The scheme first proposes a simple transformation procedure to transform the tested linear analog circuit into a discrete signal flow graph, then constructs "diagnosing evaluators," which model the faulty components, to form a diagnosis configuration to diagnose the faults through digital simulation. This saves much computation time. Furthermore, a simple method to un-power OP's is also proposed to differentiate equivalent faults. The scheme can diagnose faults in passive components as well as active faults in OP's.

引用

页码：483 / 494

页数：12

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