INVESTIGATION OF ACCIDENTAL DEEP CENTERS IN METAL-INSULATOR-SEMICONDUCTOR STRUCTURES BY THE CAPACITANCE METHOD

被引:0
|
作者
ABDURAKHMANOV, KP
BERMAN, LS
VLASOV, SI
KOTOV, BA
机构
来源
SOVIET PHYSICS SEMICONDUCTORS-USSR | 1979年 / 13卷 / 07期
关键词
D O I
暂无
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:848 / 849
页数:2
相关论文
共 50 条
  • [21] Optical control of capacitance in a metal-insulator-semiconductor diode with embedded metal nanoparticles
    Mikhelashvili, V.
    Ankonina, G.
    Kauffmann, Y.
    Atiya, G.
    Kaplan, W. D.
    Padmanabhan, R.
    Eisenstein, G.
    JOURNAL OF APPLIED PHYSICS, 2017, 121 (21)
  • [22] INVERSION CRITERIA FOR THE METAL-INSULATOR-SEMICONDUCTOR TUNNEL STRUCTURES
    WANG, SJ
    FANG, BC
    TZENG, FC
    CHEN, CT
    CHANG, CY
    JOURNAL OF APPLIED PHYSICS, 1986, 60 (03) : 1080 - 1086
  • [23] Interface effects in ZnO metal-insulator-semiconductor and metal-semiconductor structures
    Frenzel, H.
    von Wenckstem, H.
    Lajn, A.
    Brandt, M.
    Biehne, G.
    Hochmuth, H.
    Lorenz, M.
    Grundmann, M.
    PHYSICS OF SEMICONDUCTORS, 2009, 1199 : 469 - 470
  • [24] CdS nanoparticles embedded in metal-insulator-semiconductor structures
    Malik, S
    Ray, AK
    Hassan, AK
    Nabok, AV
    PROCEEDINGS OF THE 2002 2ND IEEE CONFERENCE ON NANOTECHNOLOGY, 2002, : 265 - 268
  • [25] Light modulation in α-sexithiophene metal-insulator-semiconductor structures
    Fichou, Denis
    Charra, Fabrice
    Molecular Crystals and Liquid Crystals Science and Technology Section B: Nonlinear Optics, 1996, 15 (1-4): : 235 - 241
  • [26] Segregation of mobile ions on insulator-semiconductor interfaces in metal-insulator-semiconductor structures
    S. G. Dmitriev
    Yu. V. Markin
    Semiconductors, 2002, 36 : 197 - 202
  • [27] Capacitance and conductance characteristics of silicon nanocrystal metal-insulator-semiconductor devices
    Flynn, C.
    Koenig, D.
    Perez-Wurfl, I.
    Conibeer, G.
    Green, M. A.
    SOLID-STATE ELECTRONICS, 2009, 53 (05) : 530 - 539
  • [28] Segregation of mobile ions on insulator-semiconductor interfaces in metal-insulator-semiconductor structures
    Dmitriev, SG
    Markin, YV
    SEMICONDUCTORS, 2002, 36 (02) : 197 - 202
  • [29] High frequency capacitance measurements on metal-insulator-semiconductor structures in thermal non-equilibrium condition
    Sadeghi, M
    Jauhiainen, A
    Liss, B
    Sveinbjornsson, EO
    Engstrom, O
    POWER SEMICONDUCTOR MATERIALS AND DEVICES, 1998, 483 : 315 - 320
  • [30] High frequency capacitance measurements on metal-insulator-semiconductor structures in thermal non-equilibrium condition
    Chalmers Univ of Technology, Gothenburg, Sweden
    Solid State Electron, 12 (2233-2238):