FORMATION OF SILICON-NITRIDE COMPOUND LAYERS BY HIGH-DOSE NITROGEN IMPLANTATION

被引:0
|
作者
TSUJIDE, T [1 ]
NOJIRI, M [1 ]
KITAGAWA, H [1 ]
机构
[1] NIPPON ELECT CO LTD,DIV IC,KAWASAKI 211,JAPAN
关键词
D O I
暂无
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
下载
收藏
页码:C227 / C227
页数:1
相关论文
共 50 条
  • [21] INSULATOR STRUCTURES OBTAINED BY HIGH-DOSE NITROGEN IMPLANTATION INTO ALUMINUM ON SILICON
    LIN, CL
    HEMMENT, PLF
    NEJIM, A
    ZHANG, JP
    LI, JH
    ZOU, SC
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 74 (1-2): : 206 - 209
  • [22] Surface cavities produced by high-dose nitrogen ion implantation into silicon
    Rudolphi, M.
    Markwitz, A.
    Baumann, H.
    SURFACE AND INTERFACE ANALYSIS, 2007, 39 (08) : 698 - 701
  • [23] PROPERTIES OF EPITAXIAL SILICON LAYERS ON BURIED SILICON-NITRIDE PRODUCED BY ION-IMPLANTATION
    SKORUPA, W
    KREISSIG, U
    OERTEL, H
    BARTSCH, H
    VACUUM, 1986, 36 (11-12) : 933 - 937
  • [24] HIGH-DOSE ARSENIC IMPLANTATION OF SILICON
    BUDINOV, HI
    KARPUZOV, DS
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 73 (03): : 352 - 356
  • [25] HYDROGEN ANALYSIS IN SILICON AND SILICON-NITRIDE LAYERS
    VANDERVORST, WB
    MAES, HE
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1985, 40 (5-6) : 781 - 785
  • [26] MICROSTRUCTURE OF SILICON-ON-INSULATOR STRUCTURES PRODUCED BY HIGH-DOSE NITROGEN IMPLANTATION OF SILICON
    MEEKISON, CD
    BOOKER, GR
    REESON, KJ
    HEMMENT, PLF
    CHATER, RJ
    KILNER, JA
    DAVIS, JR
    VACUUM, 1986, 36 (11-12) : 925 - 928
  • [27] REGROWTH OF AMORPHOUS LAYERS CREATED BY HIGH-DOSE ANTIMONY IMPLANTATION IN 100 SILICON
    TAMMINGA, Y
    JOSQUIN, WJM
    APPLIED PHYSICS LETTERS, 1978, 32 (01) : 13 - 15
  • [28] PROPERTIES OF OXIDE AND NITRIDE LAYERS IN ALUMINUM PRODUCED BY HIGH-DOSE ION-IMPLANTATION
    OHIRA, S
    IWAKI, M
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1989, 116 : 153 - 160
  • [29] CHARACTERIZATION OF PLASMA SILICON-NITRIDE LAYERS
    CLAASSEN, WAP
    VALKENBURG, WGJN
    HABRAKEN, FHPM
    TAMMINGA, Y
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (12) : 2419 - 2423
  • [30] ION SYNTHESIS OF SILICON-NITRIDE HIDDEN LAYERS USING DISCONTINUOUS IMPLANTATION REGIME
    VYLETALINA, OI
    DANILIN, AB
    DRAKIN, KA
    MALININ, AA
    MORDKOVICH, VN
    PETROV, AF
    PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, 1990, 16 (22): : 68 - 71