TESTING OF DATA PATHS IN VLSI ARRAYS

被引：0
|
作者：
CHOI, YH
机构：
来源：
IEE PROCEEDINGS-E COMPUTERS AND DIGITAL TECHNIQUES | 1990年 / 137卷 / 02期
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D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
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页码：154 / 158
页数：5
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