TESTING OF DATA PATHS IN VLSI ARRAYS

被引：0

作者：

CHOI, YH

机构：

来源：

IEE PROCEEDINGS-E COMPUTERS AND DIGITAL TECHNIQUES | 1990年 / 137卷 / 02期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：154 / 158

页数：5

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