REDUNDANCY IDENTIFICATION AND REMOVAL IN COMBINATIONAL-CIRCUITS

被引:4
|
作者
MENON, PR
AHUJA, H
HARIHARA, M
机构
[1] Department of Electrical and Computer Engineering, University of Massachusetts, Amherst
[2] Intel Corp., Chandler
[3] Intel Corp., Santa Clara
关键词
D O I
10.1109/43.277639
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Identification and removal of redundancy in digital circuits is important for improving their testability as well as reducing their ama. This paper presents a method of identifying and removing redundancy in combinational circuits by analyzing circuit structure. Experimental results indicate that the method is quite efficient in execution time, but may not identify all undetectable faults. It is expected to be suitable for integration into a logic synthesis system. It can also be used as a preprocessor for a test pattern generation program or for a test pattern generation based redundancy removal program.
引用
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页码:646 / 651
页数:6
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