RING TESTING OF COMBINATIONAL-CIRCUITS

被引：0

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作者：

LITIKOV, IP

机构：

来源：

AUTOMATION AND REMOTE CONTROL | 1983年 / 44卷 / 07期

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中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

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页码：949 / 955

页数：7

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