AUTO-CORRELATION TESTING OF COMBINATIONAL-CIRCUITS

被引：2

|

作者：

ABORHEY, S

机构：

来源：

IEE PROCEEDINGS-E COMPUTERS AND DIGITAL TECHNIQUES | 1989年 / 136卷 / 01期

关键词：

D O I：

10.1049/ip-e.1989.0008

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

收藏

页码：57 / 61

页数：5

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