AVALANCHE BREAKDOWN VOLTAGE OF GAAS P+-N-N+ DIODE STRUCTURES

被引:6
|
作者
KUNO, HJ
COLLARD, JR
GOBAT, AR
机构
关键词
D O I
10.1063/1.1652679
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:343 / &
相关论文
共 50 条
  • [41] AVALANCHE BREAKDOWN VOLTAGE OF GAAS HYPERABRUPT JUNCTIONS
    SHIMIZU, A
    KOSHIMIZU, T
    [J]. SOLID-STATE ELECTRONICS, 1981, 24 (12) : 1155 - 1160
  • [42] INFLUENCE OF PHOTON GENERATION ON THE FORWARD CURRENT-VOLTAGE CHARACTERISTICS OF GALLIUM-ARSENIDE P+-N-N+ STRUCTURES
    ASHKINAZI, GA
    KIVI, UM
    TIMOFEEV, VN
    [J]. SOVIET PHYSICS SEMICONDUCTORS-USSR, 1982, 16 (03): : 314 - 315
  • [43] HOLE AND ELECTRON CURRENTS IN DIFFUSED P+-N-N+ DIODES AND IIL STRUCTURES
    ROULSTON, DJ
    ELSAID, MH
    [J]. PROCEEDINGS OF THE IEEE, 1977, 65 (02) : 271 - 272
  • [44] INSTABILITY OF CURRENT IN SILICON P+-N-N+ STRUCTURES IN A MAGNETIC-FIELD
    AMIRKHANOV, KI
    BASHIROV, RI
    ISAEV, MR
    ALIEV, BG
    [J]. SOVIET PHYSICS SEMICONDUCTORS-USSR, 1975, 9 (11): : 1429 - 1430
  • [45] AN N+-N-P GERMANIUM AVALANCHE PHOTO-DIODE
    KANEDA, T
    KAGAWA, S
    MIKAWA, T
    TOYAMA, Y
    ANDO, H
    [J]. APPLIED PHYSICS LETTERS, 1980, 36 (07) : 572 - 574
  • [46] FORWARD CURRENT-VOLTAGE AND SWITCHING CHARACTERISTICS OF P+-N-N+ (EPITAXIAL) DIODES
    DUTTON, RW
    WHITTIER, RJ
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1969, ED16 (05) : 458 - &
  • [47] Avalanche breakdown and breakdown luminescence in p-π-n GaN diodes
    Osinsky, A
    Shur, MS
    Gaska, R
    Chen, Q
    [J]. ELECTRONICS LETTERS, 1998, 34 (07) : 691 - 692
  • [48] Lateral polysilicon p+-p-n+ and p+-n-n+ diodes
    Karnik, SV
    Hatalis, MK
    [J]. SOLID-STATE ELECTRONICS, 2003, 47 (04) : 653 - 659
  • [49] INVESTIGATION OF THE ELECTRICAL FIELDS IN HIGH-VOLTAGE SILICON P+-N-N+ JUNCTIONS
    GREKHOV, IV
    KIREEV, OA
    SHOROKHOVA, VS
    [J]. RADIOTEKHNIKA I ELEKTRONIKA, 1979, 24 (09): : 1904 - 1909
  • [50] On the n+-GaAs/δ(p+)-GaInP/n-GaAs high breakdown voltage field-effect transistor
    Chang, WL
    Cheng, SY
    Shie, YH
    Pan, HJ
    Lour, WS
    Liu, WC
    [J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1999, 14 (04) : 307 - 311