TECHNIQUES FOR MEASUREMENT OF SOURCE AND DRAIN SERIES RESISTANCE IN MOS TRANSISTORS

被引：2
|
作者：
MELLOR, PJT
机构：
来源：
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON | 1971年 / 118卷 / 10期
关键词：
D O I：
10.1049/piee.1971.0261
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1393 / &
相关论文
共 50 条
  • [21] MEASUREMENT OF SERIES COLLECTOR RESISTANCE IN BIPOLAR-TRANSISTORS
    MACK, WD
    HOROWITZ, M
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1982, 17 (04) : 767 - 773
  • [22] PARASITIC SOURCE AND DRAIN RESISTANCE IN HIGH-ELECTRON-MOBILITY TRANSISTORS.
    Lee, S.J.
    Crowell, C.R.
    Solid-State Electronics, 1985, 28 (07): : 659 - 668
  • [23] Effect of nickel concentration on source/drain series resistance and channel resistance of Ni-metal-induced crystallization thin-film transistors
    Lai, Ming-Hui
    Wu, YewChung Sermon
    Huang, Jung-Jie
    THIN SOLID FILMS, 2013, 544 : 500 - 503
  • [24] Source/Drain Series Resistance Induced Feedback Effect on Drain Current Mismatch and Its Implication
    Kuo, Jack J. -Y.
    Fan, Ming-Long
    Lee, Wei
    Su, Pin
    2013 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS, AND APPLICATIONS (VLSI-TSA), 2013,
  • [25] Source/drain series-resistance effects in amorphous gallium-indium zinc-oxide thin film transistors
    Park, Jaechul
    Kim, Changjung
    Kim, Sunil
    Song, Hun
    Kim, Sangwook
    Kang, Donghun
    Lim, Hyuck
    Yin, Huaxiang
    Jung, Ranju
    Lee, Eunha
    Lee, Jaecheol
    Kwon, Kee-Won
    Park, Youngsoo
    IEEE ELECTRON DEVICE LETTERS, 2008, 29 (08) : 879 - 881
  • [26] TEMPERATURE DEPENDENCE OF DRAIN CURRENT OF MOS-TRANSISTORS
    STILLGER, J
    ZEITSCHRIFT FUR ANGEWANDTE PHYSIK, 1968, 25 (04): : 177 - +
  • [27] SERIES RESISTANCE OF SELF-ALIGNED SILICIDED SOURCE DRAIN STRUCTURE
    TSUI, BY
    CHEN, MC
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (01) : 197 - 206
  • [28] SOURCE-AND-DRAIN SERIES RESISTANCE OF LDD MOSFET'S.
    Sheu, B.J.
    Hu, C.
    Ko, P.K.
    Hsu, F.-C.
    1600, (EDL-5):
  • [29] A simple method to extract source/drain series resistance for advanced MOSFETs
    Chang, Y. H.
    Wu, Y. F.
    Ho, C. S.
    EDSSC: 2007 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS, VOLS 1 AND 2, PROCEEDINGS, 2007, : 87 - 90
  • [30] Series resistance in vertical MOSFETs with reduced drain/source overlap capacitance
    Tan, L.
    Hall, S.
    Buiu, O.
    Hakim, M. M. A.
    Uchino, T.
    Ashburn, P.
    Redman-White, W.
    ULIS 2008: PROCEEDINGS OF THE 9TH INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON, 2008, : 187 - +
12345