TECHNIQUES FOR MEASUREMENT OF SOURCE AND DRAIN SERIES RESISTANCE IN MOS TRANSISTORS

被引：2
|
作者：
MELLOR, PJT
机构：
来源：
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON | 1971年 / 118卷 / 10期
关键词：
D O I：
10.1049/piee.1971.0261
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：1393 / &
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