EFFECTS OF RACES, DELAYS, AND DELAY FAULTS ON TEST GENERATION

被引：12
|
作者：
BREUER, MA
机构：
[1] HUGHES AIRCRAFT CO, FULLERTON, CA USA
[2] UNIV SO CALIF, DEPT ELECT ENGN, LOS ANGELES, CA 90007 USA
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1974年 / C 23卷 / 10期
关键词：
D O I：
10.1109/T-C.1974.223808
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：1078 / 1092
页数：15
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