GAS-SURFACE INTERACTION IN ATOM-PROBE FIELD-ION MICROSCOPE

被引：1
|
作者：
NAKAMURA, S [1 ]
KURODA, T [1 ]
机构：
[1] OSAKA UNIV,INST SCI & IND RES,SUITA,OSAKA 565,JAPAN
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 1977年 / 16卷 / 04期
关键词：
D O I：
10.1143/JJAP.16.657
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：657 / 658
页数：2
相关论文
共 50 条
  • [1] SURFACE MICROSCOPY AND ANALYSIS WITH ATOM-PROBE FIELD-ION MICROSCOPE
    TURNER, PJ
    REGAN, BJ
    SOUTHON, MJ
    [J]. VACUUM, 1972, 22 (10) : 443 - 446
  • [2] CONSTRUCTION AND DEVELOPMENT OF ATOM-PROBE FIELD-ION MICROSCOPE
    GALLOT, J
    SARRAU, J
    BOSTEL, A
    [J]. VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1975, 30 (179): : 173 - 181
  • [3] A GONIOMETER HEAD FOR AN ATOM-PROBE FIELD-ION MICROSCOPE
    SARRAU, JM
    GALLOT, J
    AVENEL, O
    ROUBEAU, P
    [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (07): : 800 - 802
  • [4] ATOM-PROBE FIELD-ION MICROSCOPE ANALYSIS OF SURFACES OF MATERIALS
    TSONG, TT
    CHEN, CL
    LIU, J
    [J]. JOURNAL OF MATERIALS RESEARCH, 1989, 4 (06) : 1549 - 1559
  • [5] MICROANALYSIS OF WELDS USING FIELD-ION MICROSCOPE ATOM-PROBE
    GADGIL, VJ
    KOLSTER, BH
    [J]. POLYMER-PLASTICS TECHNOLOGY AND ENGINEERING, 1994, 33 (06) : 691 - 712
  • [6] SIMPLIFIED METHOD FOR CALIBRATION OF AN ATOM-PROBE FIELD-ION MICROSCOPE
    WAGNER, A
    HALL, TM
    SEIDMAN, DN
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (08): : 1032 - 1034
  • [7] ATOM-PROBE FIELD-ION MICROSCOPY
    LEISCH, M
    [J]. MIKROCHIMICA ACTA, 1992, 107 (3-6) : 95 - 104
  • [8] FIELD-ION MICROSCOPE AND ATOM-PROBE STUDIES OF SCANNING TUNNELING MICROSCOPE TIPS
    NISHIKAWA, O
    HATTORI, K
    KATSUKI, F
    TOMITORI, M
    [J]. JOURNAL DE PHYSIQUE, 1988, 49 (C-6): : 55 - 59
  • [9] ATOM-PROBE FIELD-ION MICROSCOPY
    MULLER, EW
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1971, 8 (01): : 89 - &
  • [10] ATOM-PROBE FIELD-ION MICROSCOPY
    MILLER, MK
    [J]. VACUUM, 1994, 45 (6-7) : 819 - 831
12345