A GONIOMETER HEAD FOR AN ATOM-PROBE FIELD-ION MICROSCOPE

被引：3
|
作者：
SARRAU, JM [1 ]
GALLOT, J [1 ]
AVENEL, O [1 ]
ROUBEAU, P [1 ]
机构：
[1] CENS,SERV PHYS SOLIDE & RESONANCE MAGNET,F-91190 GIF SUR YVETTE,FRANCE
来源：
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1981年 / 14卷 / 07期
关键词：
D O I：
10.1088/0022-3735/14/7/004
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：800 / 802
页数：3
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