SIMPLIFIED METHOD FOR CALIBRATION OF AN ATOM-PROBE FIELD-ION MICROSCOPE

被引：23
|
作者：
WAGNER, A
HALL, TM
SEIDMAN, DN
机构：
[1] CORNELL UNIV,DEPT MAT SCI & ENGN,BARD HALL,ITHACA,NY 14853
[2] CORNELL UNIV,MAT SCI CTR,BARD HALL,ITHACA,NY 14853
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1975年 / 46卷 / 08期
关键词：
D O I：
10.1063/1.1134386
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1032 / 1034
页数：3
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