EFFECTS OF IONIZING-RADIATION ON VARIOUS CMOS INTEGRATED-CIRCUIT STRUCTURES

被引：12

作者：

KING, EE ^{[1
]}

NELSON, GP ^{[1
]}

HUGHES, HL ^{[1
]}

机构：

[1] USN,RES LAB,WASHINGTON,DC 20390

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1972年 / NS19卷 / 06期

关键词：

D O I：

10.1109/TNS.1972.4326843

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：264 / 270

页数：7

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