CONSTRUCTION OF EFFICIENCY CURVES FOR SEMICONDUCTOR X-RAY SPECTROMETERS

被引：43

作者：

CAMPBELL, JL

MCNELLES, LA

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS | 1972年 / 98卷 / 03期

关键词：

D O I：

10.1016/0029-554X(72)90225-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：433 / &

共 50 条

[1] SEMICONDUCTOR X-RAY SPECTROMETERS
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[8] IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
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