SEMICONDUCTOR X-RAY SPECTROMETERS

被引：14

作者：

MUGGLETON, AH

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS | 1972年 / 101卷 / 01期

关键词：

D O I：

10.1016/0029-554X(72)90765-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：113 / +

页数：1

共 50 条

[1] SEMICONDUCTOR X-RAY SPECTROMETERS
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[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1970, NS17 (01) : 363 - &
[2] RECENT DEVELOPMENTS IN SEMICONDUCTOR X-RAY SPECTROMETERS AND THEIR IMPLICATIONS TO X-RAY ANALYSES
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[J]. APPLIED SPECTROSCOPY, 1968, 22 (04) : 378 - &
[3] CONSTRUCTION OF EFFICIENCY CURVES FOR SEMICONDUCTOR X-RAY SPECTROMETERS
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[4] METHODS FOR INCREASING THE SENSITIVITY OF X-RAY SPECTROMETERS WITH A SEMICONDUCTOR DETECTOR
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[J]. INDUSTRIAL LABORATORY, 1988, 54 (02): : 136 - 140
[5] TRACE-ELEMENT DETERMINATION WITH SEMICONDUCTOR DETECTOR X-RAY SPECTROMETERS
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[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA AND REVIEW OF SCIENTIFIC INSTRUMENTS, 1924, 9 (03): : 259 - 301
[8] The resolving powers of X-ray spectrometers and the tungsten X-ray spectrum
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[J]. PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 1918, 4 : 62 - 65
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[J]. JADERNA ENERGIE, 1977, 23 (09): : 338 - 342
[10] SOFTWARE FOR MULTICHANNEL X-RAY SPECTROMETERS
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