X-RAY SPECTROMETERS FOR PIXE

被引：41
|
作者：
CAMPBELL, JL
机构：
[1] Guelph-Waterloo Program for Graduate Work in Physics, University of Guelph, Guelph
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 49卷 / 1-4期
基金：
加拿大自然科学与工程研究理事会;
关键词：
D O I：
10.1016/0168-583X(90)90227-L
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The accuracy of PIXE analysis is enhanced by having available a complete characterization of the Si(Li) X-ray detector as regards both efficiency and resolution function (lineshape) in the 1-35 keV X-ray energy range. Work in both these areas is reviewed, and the dead-layer concept, together with its role in low-energy response, is critically examined. The potential of other spectrometer types including high-purity germanium detectors and diffraction spectrometers is briefly considered. © 1990.
引用
收藏
页码：115 / 125
页数：11
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