CONSTRUCTION OF EFFICIENCY CURVES FOR SEMICONDUCTOR X-RAY SPECTROMETERS

被引：44
|
作者：
CAMPBELL, JL
MCNELLES, LA
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS | 1972年 / 98卷 / 03期
关键词：
D O I：
10.1016/0029-554X(72)90225-X
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：433 / &
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