ELECTRICAL-PROPERTIES OF LINE DEFECTS IN THIN ZONE-RECRYSTALLIZED SILICON FILMS ON SILICON DIOXIDE

被引：11

|

作者：

MABY, EW

ANTONIADIS, DA

机构：

来源：

APPLIED PHYSICS LETTERS | 1982年 / 40卷 / 08期

关键词：

D O I：

10.1063/1.93237

中图分类号：

O59 [应用物理学];

学科分类号：

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页码：691 / 693

页数：3

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