OBSERVATION OF THE DEFECTS IN SEMICONDUCTORS BY PULSED SCANNING ELECTRON-MICROSCOPY

被引：0
|
作者：
BOULOU, M
SCHILLER, C
机构：
来源：
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1981年 / 6卷 / 01期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：39 / 53
页数：15
相关论文
共 50 条
  • [31] INTRODUCTION OF SCANNING ELECTRON-MICROSCOPY TO OBSERVATION OF HARD TISSUES, AND RESULTS
    TAKIGUCHI, R
    JOURNAL OF ELECTRON MICROSCOPY, 1982, 31 (01): : 106 - 106
  • [32] STROBOSCOPIC OBSERVATION OF PASSIVATED MICROPROCESSOR CHIPS BY SCANNING ELECTRON-MICROSCOPY
    NAKAMAE, K
    ISHISAKA, M
    FUJIOKA, H
    URA, K
    JOURNAL OF ELECTRON MICROSCOPY, 1982, 31 (03): : 285 - 285
  • [33] OBSERVATION OF NUCLEOSOME AND DNA BY ULTRAHIGH RESOLUTION SCANNING ELECTRON-MICROSCOPY
    INAGA, S
    OSATAKE, H
    IINO, A
    TANAKA, K
    JOURNAL OF ELECTRON MICROSCOPY, 1990, 39 (04): : 342 - 342
  • [34] OBSERVATION OF RIBOSOMES BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPY (STEM)
    CURGY, JJ
    PERASSO, R
    MORY, C
    ANDRE, J
    COLLIEX, C
    BIOLOGY OF THE CELL, 1982, 44 (01) : A37 - A37
  • [35] OBSERVATION OF DIFFERENT YEAST STRAINS AND THEIR PROTOPLASTS BY SCANNING ELECTRON-MICROSCOPY
    MIEGEVILLE, M
    MORIN, O
    COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE D, 1976, 283 (04): : 417 - &
  • [36] SILVER BERM CONTAINMENT OF POLLEN FOR OBSERVATION WITH SCANNING ELECTRON-MICROSCOPY
    CHISSOE, WF
    VEZEY, EL
    SKVARLA, JJ
    GRANA, 1989, 28 (03) : 211 - 214
  • [37] OBSERVATION OF SWARMING OF PROTEUS-MIRABILIS WITH SCANNING ELECTRON-MICROSCOPY
    VANDERMOLEN, GE
    WILLIAMS, FD
    CANADIAN JOURNAL OF MICROBIOLOGY, 1977, 23 (01) : 107 - 112
  • [38] METAL DEFECTS IN COOLING CIRCUITS UNCOVERED BY SCANNING ELECTRON-MICROSCOPY
    ENGEL, L
    KLINGELE, H
    METALL, 1976, 30 (08): : 720 - 728
  • [39] SCANNING ELECTRON-MICROSCOPY OF SUPERFICIAL DEFECTS IN ARTICULAR-CARTILAGE
    GHADIALLY, FN
    ORYSCHAK, AF
    CANADIAN JOURNAL OF SURGERY, 1976, 19 (04) : 337 - 337
  • [40] ELECTRON-MICROSCOPY OF INTERFACES IN SEMICONDUCTORS
    HUMPHREYS, CJ
    VACUUM, 1988, 38 (4-5) : 427 - 427
12345