PROSPECTS FOR EXTENDING THE RESOLUTION LIMIT OF THE ELECTRON-MICROSCOPE

被引：11
|
作者：
GLAESER, RM [1 ]
机构：
[1] UNIV CALIF BERKELEY,DONNER LAB,BERKELEY,CA 94720
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1979年 / 117卷 / SEP期
关键词：
D O I：
10.1111/j.1365-2818.1979.tb00232.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：77 / 91
页数：15
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