PROSPECTS FOR EXTENDING THE RESOLUTION LIMIT OF THE ELECTRON-MICROSCOPE

被引：11

作者：

GLAESER, RM ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY,DONNER LAB,BERKELEY,CA 94720

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1979年 / 117卷 / SEP期

关键词：

D O I：

10.1111/j.1365-2818.1979.tb00232.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：77 / 91

页数：15

共 50 条

[21] THRESHOLD SPECTROSCOPIES AND PROSPECTS FOR THEIR APPLICATION IN THE SCANNING ELECTRON-MICROSCOPE
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