HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPE

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作者：

KOIKE, H ^{[1
]}

机构：

[1] INT PRECIS INC,HACHIOJI,TOKYO 192,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1983年 / 32卷 / 01期

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中图分类号：

TH742 [显微镜];

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页码：67 / 67

页数：1

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