HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPE

被引：0

作者：

KOIKE, H ^{[1
]}

机构：

[1] INT PRECIS INC,HACHIOJI,TOKYO 192,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1983年 / 32卷 / 01期

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D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：67 / 67

页数：1

共 50 条

[31] HIGH-RESOLUTION ELECTRON-MICROSCOPE STUDIES OF DEFECTS IN CRYSTALS
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[J]. MICRON, 1980, 11 (3-4) : 243 - 246
[32] PRACTICAL PROCEDURE FOR ALIGNMENT OF A HIGH-RESOLUTION ELECTRON-MICROSCOPE
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[J]. ULTRAMICROSCOPY, 1979, 4 (02) : 241 - 245
[33] DEVELOPMENT OF A 200 KV HIGH-RESOLUTION ELECTRON-MICROSCOPE
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[34] DIGITAL PROCESSINGS FOR HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES
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[J]. JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (01): : 72 - 72
[35] STRUCTURE AND STRAIN DETERMINATION IN THE HIGH-RESOLUTION ELECTRON-MICROSCOPE
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[36] PROSPECTS FOR HIGH-RESOLUTION ELECTRON ENERGY-LOSS EXPERIMENTS WITH THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
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[J]. ULTRAMICROSCOPY, 1985, 18 (1-4) : 125 - 129
[37] ELECTRON-MICROSCOPE TRANSMISSION ELECTRON-MICROSCOPE AND SCANNING ELECTRON-MICROSCOPE
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[J]. DENKI KAGAKU, 1986, 54 (08): : 667 - 670
[38] COMPUTER-CONTROLLED SCANNING ELECTRON-MICROSCOPE SYSTEM FOR HIGH-RESOLUTION MICROELECTRONIC PATTERN FABRICATION
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[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1972, ED19 (05) : 624 - +
[39] HIGH-RESOLUTION ELECTRON HOLOGRAPHY WITH FIELD-EMISSION ELECTRON-MICROSCOPE
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[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (01) : 9 - 14
[40] SPECIMENS FOR TESTING RESOLUTION OF SCANNING ELECTRON-MICROSCOPE
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