HIGH-RESOLUTION 400-KV ELECTRON-MICROSCOPE

被引：0
|
作者：
HONDA, T [1 ]
IBE, K [1 ]
SUZUKI, S [1 ]
ISHIDA, Y [1 ]
机构：
[1] JEOL LTD,TOKYO 196,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1985年 / 34卷 / 03期
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D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：215 / 215
页数：1
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