INFLUENCE OF ELECTRODE MACROSCOPIC CURVATURE UPON SURFACE-ROUGHNESS EFFECTS IN COMPRESSED SF6

被引：13
|
作者：
MCALLISTER, IW
机构：
来源：
ARCHIV FUR ELEKTROTECHNIK | 1980年 / 62卷 / 01期
关键词：
D O I：
10.1007/BF01578116
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：43 / 49
页数：7
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