TEST-GENERATION FOR SEQUENTIAL-CIRCUITS

被引：53

作者：

MA, HKT

DEVADAS, S

NEWTON, AR

SANGIOVANNIVINCENTELLI, A

机构：

来源：

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1988年 / 7卷 / 10期

关键词：

D O I：

10.1109/43.7807

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：1081 / 1093

页数：13

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