AN ALGEBRAIC TEST-GENERATION PROCEDURE FOR SEQUENTIAL-CIRCUITS

被引：0

作者：

MEO, AR

MEZZALAMA, M

PRINETTO, P

机构：

来源：

ALTA FREQUENZA | 1984年 / 53卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TN [电子技术、通信技术];

学科分类号：

0809 ;

摘要：

引用

页码：126 / 142

页数：17

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