2 TEST-GENERATION METHODS FOR SEQUENTIAL-CIRCUITS

被引：0

作者：

HAYASHI, T

HATAYAMA, K

ISHIYAMA, S

TAKAKURA, M

机构：

来源：

1989 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-3 | 1989年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1942 / 1945

页数：4

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