TEST-GENERATION FOR SEQUENTIAL-CIRCUITS

被引：53
|
作者：
MA, HKT
DEVADAS, S
NEWTON, AR
SANGIOVANNIVINCENTELLI, A
机构：
[1] Univ of California, Berkeley, CA,, USA
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1988年 / 7卷 / 10期
关键词：
Manuscript received February 8. 1988; revised May 28; 1988. This work was supported in part by the Semiconductor Research Corporation under Grant 442427-52055. by the Defense Advanced Research Projects Agency under Contract N00039-86-R-0365; and by a grant from AT&T Bell Lab-oratoric. The review of this paper was arranged by Associate Editor V. K. Aganval;
D O I：
10.1109/43.7807
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
18
引用
收藏
页码：1081 / 1093
页数：13
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