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- [2] MEASUREMENT OF THE CHARGE MINORITY-CARRIERS LIFE TIME IN THE HIGH-RESISTANCE LAYERS OF TRANSISTOR STRUCTURES [J]. RADIOTEKHNIKA I ELEKTRONIKA, 1981, 26 (07): : 1514 - 1521
- [6] PHOTOCAPACITANCE DETECTION OF MINORITY-CARRIER RECOMBINATION AT THE EDGE OF A SPACE-CHARGE REGION [J]. JOURNAL DE PHYSIQUE, 1979, 40 (03): : 321 - 324