THICKNESS MONITORING DURING DEPOSITION OF ANTIREFLECTION COATINGS

被引：0
|
作者：
EFREMOV, AE
AGAFONOV, BI
机构：
来源：
SOVIET JOURNAL OF OPTICAL TECHNOLOGY | 1979年 / 46卷 / 01期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：48 / 49
页数：2
相关论文
共 50 条
  • [31] Antireflection temporal coatings
    Pacheco-Pena, Victor
    Engheta, Nader
    OPTICA, 2020, 7 (04): : 323 - 331
  • [32] Wide-Angle Broadband Antireflection Coatings Prepared by Atomic Layer Deposition
    Pfeiffer, Kristin
    Ghazaryan, Lilit
    Schulz, Ulrike
    Szeghalmi, Adriana
    ACS APPLIED MATERIALS & INTERFACES, 2019, 11 (24) : 21887 - 21894
  • [33] Optimizing the Position of a Rotating Substrate during Magnetron Deposition of Thickness-Uniform Coatings
    Rogov, A. V.
    Kapustin, Yu. V.
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 2019, 62 (01) : 109 - 115
  • [34] Optimizing the Position of a Rotating Substrate during Magnetron Deposition of Thickness-Uniform Coatings
    A. V. Rogov
    Yu. V. Kapustin
    Instruments and Experimental Techniques, 2019, 62 : 109 - 115
  • [35] ANTIREFLECTION COATINGS ON GLASS
    YOUNG, L
    APPLIED OPTICS, 1965, 4 (03): : 366 - &
  • [36] MONITORING FILM THICKNESS IN COURCE OF DEPOSITION
    LOGVINENKO, AG
    BLYUMKIN.YA
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1969, (05): : 1238 - +
  • [37] New coatings can be created in combining ion assisted deposition (IAD) coatings with wide band optical monitoring of the thickness of the layers
    Merry, Christian
    Materiaux et Techniques, 2010, 98 (02): : 110 - 112
  • [38] BALANCED 2-WAVE METHOD OF MONITORING LAYER THICKNESS DURING DEPOSITION
    PUTILIN, ES
    ELGART, ZE
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1991, 58 (09): : 577 - 579
  • [39] The Coupled Wave Thickness Method as a Universal Method for Synthesizing Interference Antireflection Coatings (π-Structures)
    Kozar, A. V.
    MOSCOW UNIVERSITY PHYSICS BULLETIN, 2020, 75 (06) : 623 - 630
  • [40] Deposition of coatings with uniform thickness on large hemispherical substrate
    Jin, Yangli
    Qiu, Yang
    Zhao, Hua
    Zu, Chengkui
    Zhenkong Kexue yu Jishu Xuebao/Journal of Vacuum Science and Technology, 2014, 34 (04): : 336 - 339
12345