THICKNESS MONITORING DURING DEPOSITION OF ANTIREFLECTION COATINGS

被引：0
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作者：
EFREMOV, AE
AGAFONOV, BI
机构：
来源：
SOVIET JOURNAL OF OPTICAL TECHNOLOGY | 1979年 / 46卷 / 01期
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暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
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页码：48 / 49
页数：2
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