DIRECT MEASUREMENT OF THE CRITICAL ANGLE OF INCIDENCE IN ELECTROCHEMICALLY ETCHED CR-39 AND MAKROFOL DETECTORS

被引：9
|
作者：
TUREK, K [1 ]
PIESCH, E [1 ]
BEDNAR, J [1 ]
机构：
[1] KERNFORSCHUNGSZENTRUM KARLSRUHE GMBH, HAUPTABT SICHERHEIT, D-76021 KARLSRUHE, GERMANY
来源：
RADIATION MEASUREMENTS | 1995年 / 24卷 / 01期
关键词：
D O I：
10.1016/1350-4487(94)00066-A
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
A very simple experimental method has been developed for the direct measurement of the critical angle using a single detector covering a cylindrical holder. On the basis of one irradiation only, all angles of interest between the detector coordinate and angle of incidence may be investigated using transformation formulas. In such a way, the critical angle of incidence has been measured for alpha particles in Makrofol DE, and alpha particles and protons in CR-39 under two commonly used electrochemical treatments: (a) combined chemical pre-etching and electrochemical etching; and (b) combined low and high frequency electrochemical etching. The influence of some parameters, e.g. particle energy, electric field strength and etching time, has also been studied.
引用
收藏
页码：43 / 51
页数：9
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