DIRECT MEASUREMENT OF THE CRITICAL ANGLE OF INCIDENCE IN ELECTROCHEMICALLY ETCHED CR-39 AND MAKROFOL DETECTORS

被引：9

作者：

TUREK, K ^{[1
]}

PIESCH, E ^{[1
]}

BEDNAR, J ^{[1
]}

机构：

[1] KERNFORSCHUNGSZENTRUM KARLSRUHE GMBH, HAUPTABT SICHERHEIT, D-76021 KARLSRUHE, GERMANY

来源：

RADIATION MEASUREMENTS | 1995年 / 24卷 / 01期

关键词：

D O I：

10.1016/1350-4487(94)00066-A

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

A very simple experimental method has been developed for the direct measurement of the critical angle using a single detector covering a cylindrical holder. On the basis of one irradiation only, all angles of interest between the detector coordinate and angle of incidence may be investigated using transformation formulas. In such a way, the critical angle of incidence has been measured for alpha particles in Makrofol DE, and alpha particles and protons in CR-39 under two commonly used electrochemical treatments: (a) combined chemical pre-etching and electrochemical etching; and (b) combined low and high frequency electrochemical etching. The influence of some parameters, e.g. particle energy, electric field strength and etching time, has also been studied.

引用

页码：43 / 51

页数：9

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