ELECTRON-BEAM TESTING OF INTEGRATED-CIRCUITS

被引：1
|
作者：
REHME, H
机构：
来源：
PHYSICS IN TECHNOLOGY | 1979年 / 10卷 / 03期
关键词：
D O I：
10.1088/0305-4624/10/3/I02
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：97 / 103
页数：7
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