共 50 条
- [2] ELECTRON-BEAM TESTING OF INTEGRATED-CIRCUITS [J]. PHYSICS IN TECHNOLOGY, 1979, 10 (03): : 97 - 103
- [3] ELECTRON-BEAM PROBING OF INTEGRATED-CIRCUITS [J]. SOLID STATE TECHNOLOGY, 1985, 28 (12) : 63 - 70
- [4] ELECTRON-BEAM TEST TECHNIQUES FOR INTEGRATED-CIRCUITS [J]. SCANNING ELECTRON MICROSCOPY, 1981, : 305 - 322
- [5] FUNDAMENTALS OF ELECTRON-BEAM TESTING OF INTEGRATED-CIRCUITS [J]. SCANNING, 1983, 5 (03) : 103 - 122
- [6] ELECTRON-BEAM SYSTEM TO FABRICATE INTEGRATED-CIRCUITS [J]. JOURNAL OF THE FRANKLIN INSTITUTE-ENGINEERING AND APPLIED MATHEMATICS, 1973, 296 (06): : 403 - &
- [8] TECHNIQUES FOR ELECTRON-BEAM TESTING AND RESTRUCTURING INTEGRATED-CIRCUITS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (04): : 1010 - 1013
- [9] ELECTRON-BEAM TESTING OF INTEGRATED-CIRCUITS WITH MULTILEVEL METAL [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06): : 2037 - 2040
- [10] ELECTRON-BEAM INDUCED CURRENT ANALYSIS OF INTEGRATED-CIRCUITS [J]. SCANNING ELECTRON MICROSCOPY, 1981, : 295 - 304